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Current luminous flux depreciation test at luminaire and lamp level requires a minimum of 6000 h testing, which is even longer than the product development cycle time. Dr. Yuan and his team have developed accelerated method for SSL products.
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Failure of a complex SSL system always consists of multiple root causes at component level, and multiple interactions of these multiple failure modes. Hence, we provide a graphical statistical based framework to approach SSL system reliability prediction.
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Because the diversity and complexity of the LED lighting product design, it results in system failure modes which can occur in various value chains, and interact with each other.
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The SSL reliability is a multi-function, multi-disciplinary, multi-scaled, multi-technologies, multi-materials and multi-interfaces. Nowadays the “Trial-and-error” is mostly applied. It causes the long “time-to-market” without the guarantee of “first time right”. Due to lacking of the fundamental research upon the SSL reliability and modeling methods, it causes of about 3B (usd) annual losses.
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